Robert Y. Hsiao

Oliff & Berridge, PLC

277 South Washington Street

Suite 500

Alexandria, Virginia 22314

Telephone: (703) 836-6400

Facsimile:  (703) 836-2787

Email: rhsiao@oliff.com

Position:

Associate

Admitted:

Virginia, 2010

U.S. Patent and Trademark Office, 2010

Education:

Washington University School of Law, 2010
J.D., Juris Doctor

 

University of Illinois, Champaign-Urbana, IL, 2003
B.S., Bachelor of Science in Computer Engineering

Published:

"An Improved Alignment Layer Grown by Oblique Evaporation for Liquid Crystal Devices", Liou, chen, Ho, Hsu, Chang, Hsiao, S-H Chang

 

"Performance Evaluation of the Metal Induced Lateral Crystallization (MILC) Poly-Sil-xGex thin films for Optoelectronic Applications", Chen Hsiao, Ho