Yanwen Fei 

Oliff & Berridge, PLC

277 South Washington Street

Suite 500

Alexandria, Virginia 22314

Telephone: (703) 836-6400

Facsimile:  (703) 836-2787

E-mail: yfei@oliff.com

Position:

Technical Specialist

Education:

Carnegie Mellon University, Pittsburgh, PA, Expected 05/2007
Ph.D., Doctor of Philosophy in Electrical and Computer Engineering

Tsinghua University, Beijing, P.R. China, 1995
M.S., Master of Science in Microelectronics

Tsinghua University, Beijing, P.R. China, 1993
B.S., Bachelor of Science in Electrical Engineering

Publications:

Y. Fei, W. Maly, "Utilization of Wafer Sort Test in Boundless Deformation Learning", submitted.

T. Vogels, T. Zanon, R, Desineni, R. D. Blanton, W. Maly, J. G. Brown, J. E. Nelson, Y. Fei, X. Huang, P. Gopalakrishnan, M. Mishra, V. Rovner, S. Tiwary, "Benchmarking Diagnosis Algorithms with a Diverse Set of IC Deformations", International Test Conference, 2004, pp. 508 - 517

Y. Fei, P. Simon, W. Maly, "New Yield Models for DSM Manufacturing", International Electron Devices Meeting, 2000, pp. 845 - 848.