Yanwen Fei

Oliff & Berridge, PLC
277 South Washington Street
Suite 500
Alexandria, Virginia 22314
Telephone: (703) 836-6400
Facsimile: (703) 836-2787
E-mail: yfei@oliff.com

Position:

Technical Specialist

Education:

Carnegie Mellon University, Pittsburgh, PA, Expected 05/2007
Ph.D., Doctor of Philosophy in Electrical and Computer Engineering

Tsinghua University, Beijing, P.R. China, 1995
M.S., Master of Science in Microelectronics

Tsinghua University, Beijing, P.R. China, 1993
B.S., Bachelor of Science in Electrical Engineering

Publications:

Y. Fei, W. Maly, "Utilization of Wafer Sort Test in Boundless Deformation Learning", submitted.

T. Vogels, T. Zanon, R, Desineni, R. D. Blanton, W. Maly, J. G. Brown, J. E. Nelson, Y. Fei, X. Huang, P. Gopalakrishnan, M. Mishra, V. Rovner, S. Tiwary, "Benchmarking Diagnosis Algorithms with a Diverse Set of IC Deformations", International Test Conference, 2004, pp. 508 - 517

Y. Fei, P. Simon, W. Maly, "New Yield Models for DSM Manufacturing", International Electron Devices Meeting, 2000, pp. 845 - 848.

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